Study on the XPS-ESCA of Aluminum Phosphide Products

International Journal of Molecular Sciences

Canping Pan¹  Weixi Li² 

[1] id="af1-ijms-06-00198">College of Applied Chemistry, China Agricultural University, Beijin 100094, China Tel.: [phone], Fax: [phone], URL: http://www.cau.edu.cn/lxy

关键词: XPS;    ESCA;    aluminum phosphide;   

DOI  :  10.3390/i6030198

来源: mdpi

【 摘 要 】

XPS-ESCA analysis showed small signal for phosphorus in fresh specimens of aluminum phosphide (AlP). After removal of a layer of about 0.5 – 1.0 μm by argon ion sputtering, it was observed that signal intensities from oxygen and aluminum increased. The oxygen signal decreased as a function of sputtering time, synchronously with the increase of the phosphorous signal from the AlP nucleus. The aluminum signal, which was considered to be mainly due to AlP and Al(OH)₃, remained constant. Other impurity elements including N, Mg, etc., were identified in the technical 85% AlP and AlP tablet formulated products.

【 授权许可】

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