| Sensors | |
| Inter-Comparison of ASTER and MODIS Surface Reflectance and Vegetation Index Products for Synergistic Applications to Natural Resource Monitoring | |
| Tomoaki Miura1  Hiroki Yoshioka2  Kayo Fujiwara1  | |
| [1] Department of Natural Resources and Environmental Management, University of Hawaii at Manoa, 1910 East-West Road, Sherman 101, Honolulu, Hawaii 96822, U.S.A.; E-mails:;Department of Applied Information Science, Aichi Prefectural University, 1522-3 Ibaragabasama, Kumabari, Nagakute, Aichi 480-1198, Japan; E-mail: | |
| 关键词: product inter-comparison; surface reflectance; vegetation index; ASTER; MODIS; | |
| DOI : 10.3390/s8042480 | |
| 来源: mdpi | |
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【 摘 要 】
Synergistic applications of multi-resolution satellite data have been of a great interest among user communities for the development of an improved and more effective operational monitoring system of natural resources, including vegetation and soil. In this study, we conducted an inter-comparison of two remote sensing products, namely, visible/near-infrared surface reflectances and spectral vegetation indices (VIs), from the high resolution Advanced Thermal Emission and Reflection Radiometer (ASTER) (15 m) and lower resolution Moderate Resolution Imaging Spectroradiometer (MODIS) (250 m – 500 m) sensors onboard the Terra platform. Our analysis was aimed at understanding the degree of radiometric compatibility between the two sensors' products due to sensor spectral bandpasses and product generation algorithms. Multiple pairs of ASTER and MODIS standard surface reflectance products were obtained at randomly-selected, globally-distributed locations, from which two types of VIs were computed: the normalized difference vegetation index and the enhanced vegetation indices with and without a blue band. Our results showed that these surface reflectance products and the derived VIs compared well between the two sensors at a global scale, but subject to systematic differences, of which magnitudes varied among scene pairs. An independent assessment of the accuracy of ASTER and MODIS standard products, in which “in-house” surface reflectances were obtained using
【 授权许可】
Unknown
© 2008 by MDPI (http://www.mdpi.org).
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202003190058345ZK.pdf | 1475KB |
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