Orientation Effects in Ballistic High-Strained P-type Si Nanowire FETs

Sensors

Jia-Hong Zhang¹  Qing-An Huang¹  Hong Yu¹ 

[1] Key Laboratory of MEMS of Ministry of Education, Southeast University, 2 Sipailou, Nanjing, Jiangsu, People’s Republic of China; E-mails:

关键词: NW FET pressure sensor;    orientation;    uniaxial stress;    ballistic hole transport;   

DOI  :  10.3390/s90402746

来源: mdpi

【 摘 要 】

In order to design and optimize high-sensitivity silicon nanowire-field-effect transistor (SiNW FET) pressure sensors, this paper investigates the effects of channel orientations and the uniaxial stress on the ballistic hole transport properties of a strongly quantized SiNW FET placed near the high stress regions of the pressure sensors. A discrete stress-dependent six-band k.p method is used for subband structure calculation, coupled to a two-dimensional Poisson solver for electrostatics. A semi-classical ballistic FET model is then used to evaluate the ballistic current-voltage characteristics of SiNW FETs with and without strain. Our results presented here indicate that [110] is the optimum orientation for the p-type SiNW FETs and sensors. For the ultra-scaled 2.2 nm square SiNW, due to the limit of strong quantum confinement, the effect of the uniaxial stress on the magnitude of ballistic drive current is too small to be considered, except for the [100] orientation. However, for larger 5 nm square SiNW transistors with various transport orientations, the uniaxial tensile stress obviously alters the ballistic performance, while the uniaxial compressive stress slightly changes the ballistic hole current. Furthermore, the competition of injection velocity and carrier density related to the effective hole masses is found to play a critical role in determining the performance of the nanotransistors.

【 授权许可】

CC BY   
© 2009 by the authors; licensee MDPI, Basel, Switzerland