Characterization of Mixed xWO3(1-x)Y2O3 Nanoparticle Thick Film for Gas Sensing Application

Sensors

M. H. Shahrokh Abadi¹  M. N. Hamidon¹  Abdul Halim Shaari²  Norhafizah Abdullah³  Norhisam Misron¹ 

[1] Electrical and Electronic Department, Engineering Faculty, Universiti Putra Malaysia 43400, Serdang, Selangor, Malaysia; E-Mails:;Physics Department, Science Faculty, Universiti Putra Malaysia 43400, Serdang, Selangor, Malaysia; E-Mail:;Department of Chemical and Environmental of Engineering Faculty, Universiti Putra Malaysia 43400, Serdang, Selangor, Malaysia; E-Mail:

关键词: gas sensor;    thick film;    nano powder;    tungsten trioxide;    yttrium oxide;   

DOI  :  10.3390/s100505074

来源: mdpi

【 摘 要 】

Microstructural, topology, inner morphology, and gas-sensitivity of mixed xWO₃(1-x)Y₂O₃ nanoparticles (x = 1, 0.95, 0.9, 0.85, 0.8) thick-film semiconductor gas sensors were studied. The surface topography and inner morphological properties of the mixed powder and sensing film were characterized with X-ray diffraction (XRD), atomic force microscopy (AFM), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). Also, gas sensitivity properties of the printed films were evaluated in the presence of methane (CH₄) and butane (C₄H₁₀) at up to 500 °C operating temperature of the sensor. The results show that the doping agent can modify some structural properties and gas sensitivity of the mixed powder.

【 授权许可】

CC BY   
© 2010 by the authors; licensee MDPI, Basel, Switzerland.