Simplified Interval Observer Scheme: A New Approach for Fault Diagnosis in Instruments

Sensors

Albino Martínez-Sibaja²  Carlos M. Astorga-Zaragoza¹  Alejandro Alvarado-Lassman²  Rubén Posada-Gómez²  Gerardo Aguila-Rodríguez²  José P. Rodríguez-Jarquin² 

[1] Centro Nacional de Investigación y Desarrollo Tecnológico, Departamento de Ingeniería Electrónica, Interior Internado de Palmira s/n, 69490 Cuernavaca, Morelos, Mexico; E-Mails:;Instituto Tecnológico de Orizaba, División de Estudios de Posgrado e Investigación, Av. Oriente 9 No. 852, Col. Emiliano Zapata, 94320 Orizaba, Veracruz, Mexico; E-Mails:

关键词: ADM1;    interval observer;    UASB reactor;   

DOI  :  10.3390/s110100612

来源: mdpi

【 摘 要 】

There are different schemes based on observers to detect and isolate faults in dynamic processes. In the case of fault diagnosis in instruments (FDI) there are different diagnosis schemes based on the number of observers: the Simplified Observer Scheme (SOS) only requires one observer, uses all the inputs and only one output, detecting faults in one detector; the Dedicated Observer Scheme (DOS), which again uses all the inputs and just one output, but this time there is a bank of observers capable of locating multiple faults in sensors, and the Generalized Observer Scheme (GOS) which involves a reduced bank of observers, where each observer uses all the inputs and m-1 outputs, and allows the localization of unique faults. This work proposes a new scheme named Simplified Interval Observer SIOS-FDI, which does not requires the measurement of any input and just with just one output allows the detection of unique faults in sensors and because it does not require any input, it simplifies in an important way the diagnosis of faults in processes in which it is difficult to measure all the inputs, as in the case of biologic reactors.

【 授权许可】

CC BY   
© 2011 by the authors; licensee MDPI, Basel, Switzerland.