Use of a Reflectance Spectroscopy Accessory for Optical Characterization of ZnO-Bi2O3-TiO2 Ceramics

International Journal of Molecular Sciences

Mohd Sabri Mohd Ghazali¹  Azmi Zakaria¹  Zahid Rizwan¹  Halimah Mohamed Kamari¹  Mansor Hashim¹  Mohd Hafiz Mohd Zaid¹ 

[1]Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia

[2] E-Mails:

关键词: UV-Vis spectrophotometer;    Reflectance Spectroscopy Accessory;    optical band-gap;    ZnO;    Bi₂O₃;    TiO₂;   

DOI  :  10.3390/ijms12031496

来源: mdpi

【 摘 要 】

The optical band-gap energy (E_g) is an important feature of semiconductors which determines their applications in optoelectronics. Therefore, it is necessary to investigate the electronic states of ceramic ZnO and the effect of doped impurities under different processing conditions. E_g of the ceramic ZnO + xBi₂O₃ + xTiO₂, where x = 0.5 mol%, was determined using a UV-Vis spectrophotometer attached to a Reflectance Spectroscopy Accessory for powdered samples. The samples was prepared using the solid-state route and sintered at temperatures from 1140 to 1260 °C for 45 and 90 minutes. E_g was observed to decrease with an increase of sintering temperature. XRD analysis indicated hexagonal ZnO and few small peaks of intergranular layers of secondary phases. The relative density of the sintered ceramics decreased and the average grain size increased with the increase of sintering temperature.

【 授权许可】

CC BY   
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