Membrane Characterization by Microscopic and Scattering Methods: Multiscale Structure

Membranes

Rahma Tamime³  Yvan Wyart³  Laure Siozade¹  Isabelle Baudin²  Carole Deumie¹  Karl Glucina² 

[1] Institut FRESNEL (UMR 6133), Université Paul Cézanne Aix Marseille, Domaine Universitaire de St Jérôme, 13397 Marseille Cedex 20, France; E-Mails:;Suez Environnement, CIRSEE, Pôle Qualité Eau, 38, rue du Président-Wilson, 78230 Le Pecq, France; E-Mails:;Laboratoire de Mécanique, Modélisation et Procédés Propres (M2P2–CNRS UMR 6181), Université Paul Cézanne Aix Marseille, Europôle de l'Arbois, 13545 Aix en Provence Cedex 04, France; E-Mails:

关键词: membrane;    atomic force microscopy;    white light interferometry;    ellipsometry;    roughness;   

DOI  :  10.3390/membranes1020091

来源: mdpi

【 摘 要 】

Several microscopic and scattering techniques at different observation scales (from atomic to macroscopic) were used to characterize both surface and bulk properties of four new flat-sheet polyethersulfone (PES) membranes (10, 30, 100 and 300 kDa) and new 100 kDa hollow fibers (PVDF). Scanning Electron Microscopy (SEM) with “in lens” detection was used to obtain information on the pore sizes of the skin layers at the atomic scale. White Light Interferometry (WLI) and Atomic Force Microscopy (AFM) using different scales (for WLI: windows: 900 × 900 μm² and 360 × 360 μm²; number of points: 1024; for AFM: windows: 50 × 50 μm² and 5 × 5 μm²; number of points: 512) showed that the membrane roughness increases markedly with the observation scale and that there is a continuity between the different scan sizes for the determination of the RMS roughness. High angular resolution ellipsometric measurements were used to obtain the signature of each cut-off and the origin of the scattering was identified as coming from the membrane bulk.

【 授权许可】

CC BY   
© 2011 by the authors; licensee MDPI, Basel, Switzerland.