In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science

Materials

Sheridan C. Mayo¹  Andrew W. Stevenson² 

[1] CSIRO Materials Science and Engineering, Private Bag 33, Clayton, VIC 3169, Australia;

关键词: phase-contrast;    micro-tomography;    X-ray imaging;    radiography;    X-ray microscopy;   

DOI  :  10.3390/ma5050937

来源: mdpi

【 摘 要 】

X-ray phase-contrast imaging and tomography make use of the refraction of X-rays by the sample in image formation. This provides considerable additional information in the image compared to conventional X-ray imaging methods, which rely solely on X-ray absorption by the sample. Phase-contrast imaging highlights edges and internal boundaries of a sample and is thus complementary to absorption contrast, which is more sensitive to the bulk of the sample. Phase-contrast can also be used to image low-density materials, which do not absorb X-rays sufficiently to form a conventional X-ray image. In the context of materials science, X-ray phase-contrast imaging and tomography have particular value in the 2D and 3D characterization of low-density materials, the detection of cracks and voids and the analysis of composites and multiphase materials where the different components have similar X-ray attenuation coefficients. Here we review the use of phase-contrast imaging and tomography for a wide variety of materials science characterization problems using both synchrotron and laboratory sources and further demonstrate the particular benefits of phase contrast in the laboratory setting with a series of case studies.

【 授权许可】

CC BY   
© 2012 by the authors; licensee MDPI, Basel, Switzerland.