Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

International Journal of Molecular Sciences

Fabio L. Leite²  Carolina C. Bueno²  Alessandra L. Da Róz²  Ervino C. Ziemath¹ 

[1]Institute of Geosciences and Exact Sciences, São Paulo State University (UNESP), P.O. Box 178, CEP 13550-970, Rio Claro, São Paulo, Brazil

[2] E-Mail:

[3]Nanoneurobiophysics Research Group, Department of Physics, Chemistry and Mathematics, Federal University of São Carlos (UFSCar), P.O. Box 3031, CEP 18052-780, Sorocaba, São Paulo, Brazil

[4] E-Mails:

关键词: van der Waals;    adhesion;    surface forces;    atomic force microscopy;    atomic force spectroscopy;    structural forces;    double-layer;    wettability;    AFM;   

DOI  :  10.3390/ijms131012773

来源: mdpi

【 摘 要 】

The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS), it is now possible to measure these forces accurately, in addition to providing information on local material properties such as elasticity, hardness and adhesion. This review provides the theoretical and experimental background of AFS, adhesion forces, intermolecular interactions and surface forces in air, vacuum and in solution.

【 授权许可】

CC BY   
© 2012 by the authors; licensee Molecular Diversity Preservation International, Basel, Switzerland.