期刊论文详细信息
Materials
Randomness and Statistical Laws of Indentation-Induced Pop-Out in Single Crystal Silicon
Hu Huang2  Hongwei Zhao1  Chengli Shi2  Lin Zhang2  Shunguang Wan2 
[1] College of Mechanical Science & Engineering, Jilin University, Renmin Street 5988, Changchun 130025, China;
关键词: pop-out;    single crystal silicon;    maximum penetration load;    loading/unloading rate;    statistic;   
DOI  :  10.3390/ma6041496
来源: mdpi
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【 摘 要 】

Randomness and discreteness for appearance of pop-out of the single crystal silicon with a (100) orientation were studied by a self-made indentation device. For a given maximum penetration load, the load Ppo for appearance of pop-out fluctuates in a relatively large range, which makes it hard to study the effect of the loading/unloading rate on the load Ppo. Experimental results with different maximum penetration loads indicate that the critical penetration load for appearance of pop-out is in the range of 15 mN~20 mN for the current used single crystal silicon. For a given maximum penetration load, the load Ppo for appearance of pop-out seems random and discrete, but in the point of statistics, it has an obviously increasing trend with increase of the maximum penetration load and also the fraction Ppo/Pmax approximately keeps in the range of 0.2~0.5 for different maximum penetration loads changing from 15 mN to 150 mN.

【 授权许可】

CC BY   
© 2013 by the authors; licensee MDPI, Basel, Switzerland.

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