The Coefficient of the Voltage Induced Frequency Shift Measurement on a Quartz Tuning Fork

Sensors

Yubin Hou¹ 

[1] High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China; E-Mail:

关键词: qplus;    quartz tuning fork;    piezoelectric frequency effect;    eigen-frequency shift;    voltage induced frequency shift;   

DOI  :  10.3390/s141121941

来源: mdpi

【 摘 要 】

We have measured the coefficient of the voltage induced frequency shift (VIFS) of a 32.768 KHz quartz tuning fork. Three vibration modes were studied: one prong oscillating, two prongs oscillating in the same direction, and two prongs oscillating in opposite directions. They all showed a parabolic dependence of the eigen-frequency shift on the bias voltage applied across the fork, due to the voltage-induced internal stress, which varies as the fork oscillates. The average coefficient of the VIFS effect is as low as several hundred nano-Hz per millivolt, implying that fast-response voltage-controlled oscillators and phase-locked loops with nano-Hz resolution can be built.

【 授权许可】

CC BY   
© 2014 by the authors; licensee MDPI, Basel, Switzerland.