Enhanced Automatic Wavelet Independent Component Analysis for Electroencephalographic Artifact Removal

Entropy

Nadia Mammone¹ 

[1] Istituto Di Ricovero e Cura a Carattere Scientifico (IRCCS), Centro Neurolesi Bonino-Pulejo, Via Palermo c/da Casazza, SS. 113, 98124 Messina, Italy

关键词: automatic artifact rejection;    electroencephalography;    wavelet transform;    independent component analysis;    entropy;   

DOI  :  10.3390/e16126553

来源: mdpi

【 摘 要 】

Electroencephalography (EEG) is a fundamental diagnostic instrument for many neurological disorders, and it is the main tool for the investigation of the cognitive or pathological activity of the brain through the bioelectromagnetic fields that it generates. The correct interpretation of the EEG is misleading, both for clinicians’ visual evaluation and for automated procedures, because of artifacts. As a consequence, artifact rejection in EEG is a key preprocessing step, and the quest for reliable automatic processors has been quickly growing in the last few years. Recently, a promising automatic methodology, known as automatic wavelet-independent component analysis (AWICA), has been proposed. In this paper, a more efficient and sensitive version, called enhanced-AWICA (EAWICA), is proposed, and an extensive performance comparison is carried out by a step of tuning the different parameters that are involved in artifact detection. EAWICA is shown to minimize information loss and to outperform AWICA in artifact removal, both on simulated and real experimental EEG recordings.

【 授权许可】

CC BY   
© 2014 by the authors; licensee MDPI, Basel, Switzerland