Remote Sensing | |
Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat ( |
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Javier Hernandez2  Gustavo A. Lobos5  Iván Matus4  Alejandro del Pozo5  Paola Silva2  Mauricio Galleguillos3  Clement Atzberger1  | |
[1]Department of Agricultural Production, Faculty of Agronomics Sciences, University of Chile, Santiago, Casilla 1004, Chile | |
[2] E-Mail | |
[3]Department of Agricultural Production, Faculty of Agronomics Sciences, University of Chile, Santiago, Casilla 1004, Chile | |
[4] E-Mail: | |
[5]Department of Environmental Sciences, Faculty of Agronomic Sciences, University of Chile, Santa Rosa 11315, La Pintana, Santiago, Chile | |
[6]Research Regional Center-Quilamapu, Agricultural Research Institute, Chillán, Casilla 426, Chile | |
[7] E-Mail: | |
[8]Plant Breeding and Phenomic Center, Faculty of Agricultural Sciences, University of Talca, Talca, Casilla 747–721, Chile | |
[9] E-Mails: | |
关键词: drought; high-throughput; plant selection; reflectance; spectroradiometer; water stress; | |
DOI : 10.3390/rs70202109 | |
来源: mdpi | |
【 摘 要 】
Plant breeding based on grain yield (GY) is an expensive and time-consuming method, so new indirect estimation techniques to evaluate the performance of crops represent an alternative method to improve grain yield. The present study evaluated the ability of canopy reflectance spectroscopy at the range from 350 to 2500 nm to predict GY in a large panel (368 genotypes) of wheat (
【 授权许可】
CC BY
© 2015 by the authors; licensee MDPI, Basel, Switzerland.
【 预 览 】
Files | Size | Format | View |
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RO202003190016361ZK.pdf | 5701KB | download |