Spectral Index for Quantifying Leaf Area Index of Winter Wheat by Field Hyperspectral Measurements: A Case Study in Gifu Prefecture, Central Japan

Remote Sensing

Shinya Tanaka¹  Kensuke Kawamura²  Masayasu Maki⁴  Yasunori Muramoto⁷  Kazuaki Yoshida³  Tsuyoshi Akiyama⁵  Tao Cheng⁶  Zhengwei Yang⁶  Yoshio Inoue⁶  Yan Zhu⁶  Weixing Cao⁶ 

[1] Department of Forest Management, Forestry and Forest Products Research Institute, 1 Matsunosato, Tsukuba, Ibaraki 305-8687, Japan;Graduate School for International Development and Cooperation, Hiroshima University, 1-5-1 Kagamiyama, Higashi-Hiroshima 739-8529, Japan; E-Mail:;Gifu Region Agriculture and Forestry Office, 5-14-53 YabutaMinami, Gifu 500-8384, Japan; E-Mail:;Faculty of Engineering, Tohoku Institute of Technology, 35-1, YagiyamaKasumi-cho, Taihaku-ku, Sendai, Miyagi 982-8577, Japan; E-Mail:;River Basin Research Center, Gifu University, 1-1 Yanagido, Gifu 501-1193, Japan; E-Mail:;id="af1-remotesensing-07-05329">1Department of Forest Management, Forestry and Forest Products Research Institute, 1 Matsunosato, Tsukuba, Ibaraki 305-8687, Jap;Gifu Prefectural Agricultural Technology Center, 729-1 Matamaru, Gifu 501-1152, Japan; E-Mail:

关键词: ground-based measurement;    hyperspectral;    LAI;    sensitivity;    site-specific crop management;    winter wheat;   

DOI  :  10.3390/rs70505329

来源: mdpi

【 摘 要 】

Timely and nondestructive monitoring of leaf area index (LAI) using remote sensing techniques is crucial for precise and efficient management of crops. In this paper, a new spectral index (SI) for estimating LAI of winter wheat (Triticum aestivum L.) is proposed on the basis of field hyperspectral measurements. A simple index based on the empirical relationships between LAIs and SIs of all available two-waveband combinations from hyperspectral data is developed by considering the difference between reflectance values at 760 and 739 nm (DSI_R760–R739 = R₇₆₀ – R₇₃₉). Among published and newly developed SIs, DSI_R760–R739 exhibited a significant and strong linear relationship with LAI and showed outstanding performance in LAI assessments. The permissible bandwidths for broad-band DSI_R760–R739 investigated using simulated reflectance were 5 nm for both 760 and 739 nm center wavelengths. The results indicate that the linear regression model based on the narrow-band and broad-band DSI_R760–R739 is a simple but accurate method for timely and nondestructive monitoring of LAI.

【 授权许可】

CC BY   
© 2015 by the authors; licensee MDPI, Basel, Switzerland.