Double Laser for Depth Measurement of Thin Films of Ice

Sensors

Manuel Domingo Beltrán¹  Ramón Luna Molina²  Miguel Ángel Satorre Aznar²  Carmina Santonja Moltó²  Carlos Millán Verdú² 

[1] Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain;

关键词: thin films;    thickness;    refractive index;   

DOI  :  10.3390/s151025123

来源: mdpi

【 摘 要 】

The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances.

【 授权许可】

CC BY   
© 2015 by the authors; licensee MDPI, Basel, Switzerland.