Enhancement Effects of the Terahertz Near-Field Microscopy

Applied Sciences

Jian Huang¹  Zhongbo Yang¹  Dongshan Wei¹  Chunlei Du¹  Hong-Liang Cui¹ 

[1] Chongqing Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, China; E-Mails:

关键词: terahertz;    nanotip;    finite difference time domain;    enhancement effect;    effective polarizability;    dielectric constant;   

DOI  :  10.3390/app5041745

来源: mdpi

【 摘 要 】

Terahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system.

【 授权许可】

CC BY   
© 2015 by the authors; licensee MDPI, Basel, Switzerland.