METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES

Facta Universitatis, Series: Electronics and Energetics

Aleksander Y Nikiforov¹  Armen V. Sogoyan¹  Alexey S. Artamonov¹  Dmitry V. Boychenko¹ 

[1]National Research Nuclear University MEPhI, Moscow$$

关键词: Eddy current testing;    Conductive plates;    Rectangular coil;    Induced voltage;    Finite element method;   

DOI  :  

来源: University of Nis

【 摘 要 】

A method is proposed to test microelectronic parts total ionizing dose hardness based on a rationally balanced combination of gamma- and X-ray irradiation facilities. The scope of this method is identified, and a step-by-step algorithm of combined testing is provided, along with a test example of the method application.

【 授权许可】

Unknown