Measurement of copper vapour laser-induced deformation of dielectric-coated mirror surface by Michelson interferometer

Pramana

J S B Singh¹  K Dasgupta¹  S Kundu¹  J S Dhumal¹  A K Singh¹  A Wahid1¹  A Khattar¹  S K Maurya¹ 

[1] Laser & Plasma Technology Division, Beam Technology Development Group, Bhabha Atomic Research Centre, Mumbai 400 085, India$$

关键词: Michelson interferometer;    interferogram;    high reflectivity mirror;    nanoscale deformation.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

AMichelson interferometer-based technique has been used to measure the deformation of dielectric-coated mirror, caused by an incident repetitive pulsed laser beam with high average power. Minimum measurable deformation of 17 nm is reported.

【 授权许可】

Unknown