An overview of quantification methods in energy-dispersive X-ray fluorescence analysis

Pramana

A Markowicz1¹ 

[1] Department of Nuclear Sciences and Applications, Division of Physical and Chemical Sciences, Nuclear Spectrometry & Applications Laboratory, International Atomic Energy Agency, P.O. Box 100, Wagramer Strasse 5, 1400 Vienna, Austria$$

关键词: X-ray fluorescence;    X-ray spectrometry;    quantitative XRF analysis;    in situ XRF measurements.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

This paper reviews the major factors influencing the accuracy of the energy-dispersive X-ray fluorescence (EDXRF) analysis including physical and chemical matrix effects (resulting from particle size, surface irregularity, mineralogy, moisture, absorption and enhancement) as well as the correction procedures with emphasis on the analysis of unprepared samples. Quantification methods for thin samples, samples with intermediate thickness and thick samples are presented including fundamental parameter methods, influence coefficient algorithms, empirical coefficient algorithms and quantification methods based on scattered primary radiation. Quality control procedures are also reviewed.

【 授权许可】

Unknown