Influence of near-edge processes in the elemental analysis using X-ray emission-based techniques

Pramana

N Singh¹  J Goswamy¹  Gurjeet Singh¹  D Mehta1¹  Sunil Kumar¹ 

[1] Department of Physics, Panjab University, Chandigarh 160 014, India$$

关键词: X-ray absorption fine structure;    resonant Raman scattering;    characteristic X-ray;    attenuation coefficient;    X-ray emission-based techniques.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

The near-edge processes, such as X-ray absorption fine structure (XAFS) andresonant Raman scattering (RRS), are not incorporated in the available theoretical attenuation coefficients, which are known to be reliable at energies away from the shell/subshell ionization thresholds of the attenuator element. Theoretical coefficients are generally used to estimate matrix corrections in routine quantitative elemental analysis based on various X-ray emission techniques. A tabulation of characteristic X-ray energies across the periodic table is provided where those X-rays are expected to alter the attenuation coefficients due to XAFS from a particular shell/subshell of the attenuator element. The influence of XAFS to the attenuation coefficient depends upon the atomic environment and the photoelectron wave vector, i.e., difference in energies of incident X-ray and the shell/subshell ionization threshold of the attenuator element. Further, the XAFS at a shell/subshell will significantly alter the total attenuation coefficient if the jump ratio at that shell/subshell is large, e.g., the K shell, L3 subshell and M5 subshell. The tabulations can be considered as guidelines so as to know what can be expected due to XAFS in typical photon-induced X-ray emission spectrometry.

【 授权许可】

Unknown