Pramana | |
Influence of near-edge processes in the elemental analysis using X-ray emission-based techniques | |
N Singh1  J Goswamy1  Gurjeet Singh1  D Mehta11  Sunil Kumar1  | |
[1] Department of Physics, Panjab University, Chandigarh 160 014, India$$ | |
关键词: X-ray absorption ï¬ne structure; resonant Raman scattering; characteristic X-ray; attenuation coefï¬cient; X-ray emission-based techniques.; | |
DOI : | |
学科分类:物理(综合) | |
来源: Indian Academy of Sciences | |
【 摘 要 】
The near-edge processes, such as X-ray absorption ï¬ne structure (XAFS) andresonant Raman scattering (RRS), are not incorporated in the available theoretical attenuation coefï¬cients, which are known to be reliable at energies away from the shell/subshell ionization thresholds of the attenuator element. Theoretical coefï¬cients are generally used to estimate matrix corrections in routine quantitative elemental analysis based on various X-ray emission techniques. A tabulation of characteristic X-ray energies across the periodic table is provided where those X-rays are expected to alter the attenuation coefï¬cients due to XAFS from a particular shell/subshell of the attenuator element. The influence of XAFS to the attenuation coefï¬cient depends upon the atomic environment and the photoelectron wave vector, i.e., difference in energies of incident X-ray and the shell/subshell ionization threshold of the attenuator element. Further, the XAFS at a shell/subshell will signiï¬cantly alter the total attenuation coefï¬cient if the jump ratio at that shell/subshell is large, e.g., the K shell, L3 subshell and M5 subshell. The tabulations can be considered as guidelines so as to know what can be expected due to XAFS in typical photon-induced X-ray emission spectrometry.
【 授权许可】
Unknown
【 预 览 】
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RO201912040498226ZK.pdf | 267KB | download |