X-ray attenuation around 𝐾-edge of Zr, Nb, Mo and Pd: A comparative study using proton-induced X-ray emission and 241Am gamma rays

Pramana

Rajive Thomas⁴  B R S Babu⁴  K M Varier4⁴  Antony Joseph⁴  K G M Nair¹  P Magudapathy¹  N Ramachandran⁵  K K Abdullah³  K Karunakaran Nair² 

[1] Particle Irradiation Facility, Material Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India$$;Department of Physics, M.E.S. College, Ponnani 679 586, India$$;Department of Physics, Farook College, Kozhikode 673 632, India$$;Department of Physics, University of Calicut, Malappuram 673 635, India$$;Timmonsville SHS, 304 Timmonsville, South Carolina, USA$$

关键词: X-ray attenuation;    241Am;    proton-induced X-ray emission;    𝐾-edge;    thin foils.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

Mass attenuation coefficients (𝜇/ρ) for Zr, Nb, Mo and Pd elements around their 𝐾-edges are measured at 14 energies in the range 15.744–28.564 keV using secondary excitation from thin Zr, Nb, Mo, Rh, Pd, Cd and Sn foils. The measurements were carried out at the 𝐾𝛼 and 𝐾𝛽 energy values of the target elements by two techniques: (1) Proton-induced X-ray emission (PIXE) and (2) 241Am (300 mCi) source. In PIXE, 2 MeV proton-excited X-rays were detected by a Si(Li) detector. In the second case, X-rays excited by 59.54 keV photons from the targets were counted by an HPGe detector under a narrow beam good geometry set-up with sufficient shielding. The results are consistent with theoretical values derived from the XCOM package and indicate that the PIXE data have better statistical accuracy.

【 授权许可】

Unknown