Stacking faults and microstructural parameters in non-mulberry silk fibres

Pramana

S Divakara²  R Somashekar²  S Madhu2¹ 

[1] Instrumentation Division, Central Electrochemical Research Institute, Karaikudi 630 006, India$$;Department of Studies in Physics, University of Mysore, Manasagangotri, Mysore 570 006, India$$

关键词: Stacking;    crystallite size;    fibres.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

We have analysed the broadening of X-ray reflections observed in non-mulberry silk fibres in terms of stacking faults and microstructural parameters using a single-order method and have, with these parameters, developed, for the first time, a procedure to compute the whole pattern of these silk fibres. The essential deviations in the values of microstructural parameters obtained from line profile and whole pattern fitting procedures are discussed in this paper.

【 授权许可】

Unknown