Theoretical Study of Scanning Probe Microscope Images of VTe2

Bulletin of the Korean chemical society

Kee Hag Lee¹  Jeeyoung Lee¹  Wang Ro Lee¹  Sung Soo Park¹ 

关键词: Scanning tunneling microscope image;    Atomic force microscope image;    IT-VTe2;    Simulated STM and AFM images;    Ab initio method;   

DOI  :  

学科分类：化学（综合）

来源: Korean Chemical Society

【 摘 要 】

Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1TVTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.

【 授权许可】

Unknown