期刊论文详细信息
Bulletin of the Korean chemical society | |
Molecular Emission of CF4 Gas in Low-pressure Inductively Coupled Plasma | |
H. B. Lim1  T. Y. Jung1  D. H. Kim1  | |
关键词: Fluorinated carbon; CF radical; Low-pressure plasma; Inductively coupled plasma; | |
DOI : | |
学科分类:化学(综合) | |
来源: Korean Chemical Society | |
【 摘 要 】
CF4 gas is one of the most common chemicals used for dry etching in semiconductor manufacturing processes. For application to the etching process and environmental control, the low-pressure inductively coupled plasma (LP-ICP) was employed to obtain the spectrum of CF4 gas. In terms of the analysis of the spectra, trace CF radical by A-X and B-X transitions was detected. The other CFx radicals, such as CF2 and CF3, were not seen in this experiment whereas strong C and C2 emissions, dissociation products of CF4 gas, were observed.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201912010240045ZK.pdf | 778KB | download |