Preparation and characterization of LaNiO3 films grown by metal�?�organic deposition

Bulletin of materials science

Guofang Zhang¹  Yafeng Lu²  Yao Wang¹  Guo Yan²  Chengshan Li² 

[1] Key Laboratory of Applied Surface and Colloid Chemistry (Shaanxi Normal University), Ministry of Education, Xi’an 710062, P.R. China; School of Chemistry and Chemical Engineering, Shaanxi Normal University, Xi’an 710062, P.R. China$$Key Laboratory of Applied Surface and Colloid Chemistry (Shaanxi Normal University), Ministry of Education, Xi’an 710062, P.R. China; School of Chemistry and Chemical Engineering, Shaanxi Normal University, Xi’an 710062, P.R. ChinaKey Laboratory of Applied Surface and Colloid Chemistry (Shaanxi Normal University), Ministry of Education, Xi’an 710062, P.R. China; School of Chemistry and Chemical Engineering, Shaanxi Normal University, Xi’an 710062, P.R. China$$;Northwest Institute for Nonferrous Metal Research, Xi’an 710016, P.R. China$$Northwest Institute for Nonferrous Metal Research, Xi’an 710016, P.R. ChinaNorthwest Institute for Nonferrous Metal Research, Xi’an 710016, P.R. China$$

关键词: Conductive films;    LaNiO3;    metalâ€�?�organic deposition;    texture.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

We have investigated the synthesis and characterization of LaNiO₃ (LNO) layers deposited on YSZ (100) substrate by metalâ€�?�organic deposition (MOD). Texture, morphology and electrical properties of the LaNiO₃ films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM) and electrical resistivity measurement. It has been found that the formation of (â„�?00) orientation depends on pyrolysis temperature, annealing temperature and thickness of LaNiO3 layers. The LaNiO₃ films prepared under optimal condition indicate highly (â„�?00) orientation and a rather smooth surface. The LaNiO₃ films show a metallic behaviour in the measured temperature range.

【 授权许可】

Unknown