Bulletin of materials science | |
Structural and electrical properties of swift heavy ion beam irradiated Co/Si interface | |
D Kabiraj2  Ankur Jain1  I P Jain1  Shivani Agarwal1  Garima Agarwal1  | |
[1] Materials Science Laboratory, Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur 302 004, India$$Materials Science Laboratory, Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur 302 004, IndiaMaterials Science Laboratory, Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur 302 004, India$$;Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India$$Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067, IndiaNuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India$$ | |
关键词: Swift heavy ion; metal silicide; interface; GIXRD; ð¼â€�?�ð�?��?? characteristics.; | |
DOI : | |
学科分类:材料工程 | |
来源: Indian Academy of Sciences | |
【 摘 要 】
Synthesis of swift heavy ion induced metal silicide is a new advancement in materials science research. We have investigated the mixing at Co/Si interface by swift heavy ion beam induced irradiation in the electronic stopping power regime. Irradiations were undertaken at room temperature using 120 MeV Au ions at the Co/Si interface for investigation of ion beam mixing at various doses: 8 Ã�? 1012, 5 Ã�? 1013 and 1 Ã�? 1014 cm-2. Formation of different phases of cobalt silicide is identified by the grazing incidence X-ray diffraction (GIXRD) technique, which shows enhancement of intermixing and silicide formation as a result of irradiation. ð¼â€�?�ð�?��?? characteristics at Co/Si interface were undertaken to understand the irradiation effect on conduction mechanism at the interface.
【 授权许可】
Unknown
【 预 览 】
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