Simulation studies of atomic resolution X-ray holography

Bulletin of materials science

Amar Sinha¹  Yogesh Kashyap¹  B K Godwal¹  P S Sarkar¹ 

[1] High Pressure Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India$$High Pressure Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, IndiaHigh Pressure Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India$$

关键词: Simulation studies;    back reconstruction studies;    X-ray holography.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

X-ray holography is a new method of structure determination based on measurement of interference of a known reference wave with an unknown object wave (containing information on atomic sites scattering the reference wave) so that phase information is preserved. Unlike X-ray diffraction, it does not demand for translational periodicity in the material. It is based on the idea similar to that of optical holography and has been tested on crystals, quasicrystals, thin films and doped semiconductors for their structure determination. In order to analyse potentials and limitations of this technique, we have carried out theoretical simulation studies on simple structures. In this paper we describe the basic algorithm of hologram generation and reconstruction of atomic positions from generated data. We illustrate this technique using Fe (bcc) single crystal as sample case to demonstrate its capabilities and limitations. Simulations were carried out on the Cu (fcc) structure and on complex structure such as the Al�?�Pd�?�Mn quasicrystal. Technical issues such as low signal to noise ratio, twin image problem etc have been discussed briefly to emphasize the need for high intensity X-ray source such as synchrotron for experiments and proper reconstruction algorithm. Finally the scope and potential of this technique have been discussed.

【 授权许可】

Unknown