期刊论文详细信息
Bulletin of materials science | |
Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages | |
Uma Maheswar Rao1  C Venkataseshaiah1  R Sarathi1  S S M S Abdul Majeed2  | |
[1] Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India$$Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, IndiaDepartment of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India$$;Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, India$$Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, IndiaDepartment of Polymer Technology, Crescent Engineering College, Chennai 600 048, India$$ | |
关键词: Silicone rubber; surface degradation; tracking; WAXD; TGâ€�?�DTA.; | |
DOI : | |
学科分类:材料工程 | |
来源: Indian Academy of Sciences | |
【 摘 要 】
In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG�?�DTA) studies. The tracking time was different for a.c. and d.c. voltages.
【 授权许可】
Unknown
【 预 览 】
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RO201912010228326ZK.pdf | 470KB | download |