Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

Bulletin of materials science

Uma Maheswar Rao¹  C Venkataseshaiah¹  R Sarathi¹  S S M S Abdul Majeed² 

[1] Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India$$Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, IndiaDepartment of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India$$;Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, India$$Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, IndiaDepartment of Polymer Technology, Crescent Engineering College, Chennai 600 048, India$$

关键词: Silicone rubber;    surface degradation;    tracking;    WAXD;    TGâ€�?�DTA.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG�?�DTA) studies. The tracking time was different for a.c. and d.c. voltages.

【 授权许可】

Unknown