A method employing STM for the estimation of relative changes in the work function of modified metal tips

Bulletin of materials science

G U Kulkarni¹  R B Sharma²  C P Vinod¹ 

[1] Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore 560 064, India$$Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore 560 064, IndiaChemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore 560 064, India$$;INS Shivaji, Lonavla 410 402, India$$INS Shivaji, Lonavla 410 402, IndiaINS Shivaji, Lonavla 410 402, India$$

关键词: 𝐼â€�?�ð�?��? spectroscopy;    scanning tunneling microscope;    workfunction.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

𝐼�?����? spectroscopy measurements using a scanning tunnelling microscope (STM) were carried out to determine the change in the work function of a W tip following one monolayer (1 ML) deposition of Ni and subsequent annealing at 700 K. The variation in the actual gap voltage obtained from the 𝐼�?����? data of the clean tip was used in the calculation. The estimated values of the change in work function, 0.16 eV and 0.59 eV, for as-deposited and annealed tips, respectively match closely with the reported values. The method is generally applicable to chemically modified metal tips.

【 授权许可】

Unknown