| Defence Science Journal | |
| Qualification Methodologies for ICs and MMICs for Aerospace Industry | |
| Rajendra Prasad1  Anesh K Sharma1  | |
| [1] Research Centre Imarat, Hyderabad | |
| 关键词: MMIC; design verification; qualification testing; wafer-level testing; thermal characterisation; process characterisation; | |
| DOI : | |
| 学科分类:社会科学、人文和艺术(综合) | |
| 来源: Defence Scientific Information & Documentation Centre | |
PDF
|
|
【 摘 要 】
The ICsIMMICs attained importance in the field of microelectronics as these play a major role in the aerospace industry. The reliability of the ICsIMMICs becomes the critical issue because of complex material properties. A methodology has to be adopted which encompasses the qualification of ICsJMMICs for their use in the areas of strategic importance. A three-step procedure, which includes the process qualification, product qualification, and product acceptance is followed. The process qualification outlines a procedure that the foundry should follow to assure the quality, uniformity, and reproducibility from a specific process. Product qualification involves a set of simulations and measurements to establish the electrical, thermal, and reliability characteristics of a particular circuit design. Lastly, product acceptance is a series of tests performed on the deliverables
【 授权许可】
Unknown
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO201912010139699ZK.pdf | 277KB |
PDF