期刊论文详细信息
Defence Science Journal
Qualification Methodologies for ICs and MMICs for Aerospace Industry
Rajendra Prasad1  Anesh K Sharma1 
[1] Research Centre Imarat, Hyderabad
关键词: MMIC;    design verification;    qualification testing;    wafer-level testing;    thermal characterisation;    process characterisation;   
DOI  :  
学科分类:社会科学、人文和艺术(综合)
来源: Defence Scientific Information & Documentation Centre
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【 摘 要 】

The ICsIMMICs attained importance in the field of microelectronics as these play a major role in the aerospace industry. The reliability of the ICsIMMICs becomes the critical issue because of complex material properties. A methodology has to be adopted which encompasses the qualification of ICsJMMICs for their use in the areas of strategic importance. A three-step procedure, which includes the process qualification, product qualification, and product acceptance is followed. The process qualification outlines a procedure that the foundry should follow to assure the quality, uniformity, and reproducibility from a specific process. Product qualification involves a set of simulations and measurements to establish the electrical, thermal, and reliability characteristics of a particular circuit design. Lastly, product acceptance is a series of tests performed on the deliverables

【 授权许可】

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