Measurement of Out-of-plane Dynamic Deformations by Digital Speckle Pattern Interferometry

Defence Science Journal

Chandra Shakher¹  Rajesh Kurnar¹ 

[1] Indian Institute of Technology Delhi, New Delhi

关键词: Digital speckle pattem interferometry;    dynamic deformations;    large deformations;    signalto- noise ratio;    histogram equalisation;    Symlet wavelet;    Daubechies wavelet;    phase filter;    wavelet filter;    minimum-phase filter;   

DOI  :  

学科分类：社会科学、人文和艺术（综合）

来源: Defence Scientific Information & Documentation Centre

【 摘 要 】

In this paper, measurement of dynamic deformations in a rectangular plate fixed at one end, using digital speckle pattem interferometry (DSPI), has been prese,nted. To improve the measurement accuracy, a new filtering scheme has been developed. This scheme is based on the combination of average/ median filtering and Symlet wavelet filtering which enhances the signal-to-noise ratio in the speckle interferogram obtained from the DSPI. Experimental results show that this filtering scheme is quite effective in improving signal-to-noise ratio of the speckle .interferogram. The measurements by DSPI and accelerometer are in good agreement. The DSPI technique can be implemented for measuring the large deformations as well.

【 授权许可】

Unknown