期刊论文详细信息
IUCrJ
Towards phasing using high X-ray intensity
Schlichting, I.1  Boutet, S.1  Doak, R.B.1  Barends, T.R.M.1  Shoeman, R.L.1  Nanao, M.H.1  Galli, L.1  Botha, S.1  Nass, K.1  Barty, A.1  Caleman, C.1  Santra, R.1  White, T.A.1  Chapman, H.N.1  Timneanu, N.1  Son, S.-K.1 
关键词: SERIAL FEMTOSECOND CRYSTALLOGRAPHY;    HIGH-INTENSITY PHASING;    RADIATION DAMAGE;    ELECTRONIC DAMAGE;    X-RAY FREE-ELECTRON LASERS;    HIGH XFEL DOSES;   
DOI  :  10.1107/S2052252515014049
学科分类:数学(综合)
来源: International Union of Crystallography
PDF
【 授权许可】

Unknown   

【 预 览 】
附件列表
Files Size Format View
RO201912010123888ZK.pdf 433KB PDF download
  文献评价指标  
  下载次数:11次 浏览次数:10次