期刊论文详细信息
IEICE Electronics Express
Chemical flip-chip bonding method for fabricating 10-µm-pad-pitch interconnect
Yasuhiro Yamaji1  Hiroshi Nakagawa1  Masahiro Aoyagi1  Katsuya Kikuchi1  Tokihiko Yokoshima1 
[1] High Density Interconnection Group, Nanoelectronics Research Institute (NeRI) National Institute of Advanced Industrial Science and Technology (AIST)
关键词: interconnect;    flip chip;    electroless plating;    Ni-B;    fine pitch;   
DOI  :  10.1587/elex.5.732
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
PDF
【 摘 要 】

References(12)Cited-By(2)A flip-chip bonding method has been developed for fabricating ultrafine-pitch pad-to-pad interconnects. The method utilizes the preferential growth of Ni-B bridge layers on resin walls in a microscale cavity structure fabricated in the underfill resin between copper pads facing each other under some conditions of electroless Ni-B plating. In this method, the interconnect can be fabricated without loading and/or heating. By controlling the growth of the bridge layer on the resin walls in the microscale cavity under optimized plating conditions, the feasibility of ultrafine-pitch flip-chip bonding with a 10-µm pad pitch is experimentally demonstrated at a temperature of 60°C.

【 授权许可】

Unknown   

【 预 览 】
附件列表
Files Size Format View
RO201911300982833ZK.pdf 554KB PDF download
  文献评价指标  
  下载次数:9次 浏览次数:12次