IEICE Electronics Express | |
Chemical flip-chip bonding method for fabricating 10-µm-pad-pitch interconnect | |
Yasuhiro Yamaji1  Hiroshi Nakagawa1  Masahiro Aoyagi1  Katsuya Kikuchi1  Tokihiko Yokoshima1  | |
[1] High Density Interconnection Group, Nanoelectronics Research Institute (NeRI) National Institute of Advanced Industrial Science and Technology (AIST) | |
关键词: interconnect; flip chip; electroless plating; Ni-B; fine pitch; | |
DOI : 10.1587/elex.5.732 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(12)Cited-By(2)A flip-chip bonding method has been developed for fabricating ultrafine-pitch pad-to-pad interconnects. The method utilizes the preferential growth of Ni-B bridge layers on resin walls in a microscale cavity structure fabricated in the underfill resin between copper pads facing each other under some conditions of electroless Ni-B plating. In this method, the interconnect can be fabricated without loading and/or heating. By controlling the growth of the bridge layer on the resin walls in the microscale cavity under optimized plating conditions, the feasibility of ultrafine-pitch flip-chip bonding with a 10-µm pad pitch is experimentally demonstrated at a temperature of 60°C.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300982833ZK.pdf | 554KB | download |