Thermal cross-talk evaluation of densely integrated vertical cavity surface emitting laser array

IEICE Electronics Express

Fumio Koyama¹  Akihiro Matsutani¹  Takashi Kondo¹  Tomoyuki Miyamoto¹  Yasuhiro Uchiyama¹  Kazutaka Takeda¹  Takeshi Uchida¹ 

[1] Microsystem Research Center, P&I Lab., Tokyo Institute of Technology

关键词: semiconductor laser;    thermal cross talk;    laser array;    wavelength division multiplexing;    surface emitting laser;   

DOI  :  10.1587/elex.1.545

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(7)Cited-By(1)We carried out the evaluation of the thermal cross-talk in a 1.2µm band densely packed vertical cavity surface emitting laser (VCSEL) array for the first time. The spacing of neighboring elements is as small as 20µm. We measured the wavelength shift for different integrated elements, which gives us the temperature change, as a function of the distance from a heat source. We also carried out three-dimensional thermal modeling for the array, which shows good agreement with the experiment. It is predicted that the lasing wavelength of the array is affected by a thermal cross-talk when adjacent elements are operated at the same time.

【 授权许可】

Unknown