期刊论文详细信息
IEICE Electronics Express
Bit error rates of flip-flop operations with AND gate functionality using a 1.55-µm polarization bistable VCSEL
Hitoshi Kawaguchi1  Takeo Katayama1  Kazuya Nakao1  Daisuke Hayashi1 
[1] Graduate School of Materials Science, Nara Institute of Science and Technology
关键词: all-optical signal processing;    bit error rate (BER);    optical memory;    optical flip-flop;    polarization bistability;    vertical-cavity surface-emitting laser (VCSEL);   
DOI  :  10.1587/elex.12.20150479
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
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【 摘 要 】

References(17)Cited-By(1)Bit error rates (BERs) of all-optical flip-flop operations with AND-gate functionality using a 1.55-µm polarization bistable vertical-cavity surface-emitting laser (VCSEL) were measured. Optical data pulses of a 500-Mb/s return-to-zero pseudo-random bit-sequence were used. The best BER we obtained was 5.00 × 10�?9 and the eye diagram was clearly open. Input-pulse power was about 17 dB lower than VCSEL output power. From the BER variation for the set-pulse power under fixed data-pulse power, we found that fluctuations in the switching threshold and power of AND pulse (combination of data and set pulses) affect the BER. We also evaluated the BER of memory operations.

【 授权许可】

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