American Journal of Applied Sciences | |
Properties of ZnO:Ga Thin Films Deposited by dc Magnetron Sputtering: Influence of Ga-Doped Concentrations on Structural and Optical Properties | Science Publications | |
Sulhadi Sulhadi1  Sugianto Sugianto1  Dwi Suprayogi1  Didik Aryanto1  Edy Wibowo1  Putut Marwoto1  | |
关键词: ZnO:Ga Thin Films; DC Magnetron Sputtering; Structural; Optical Properties; | |
DOI : 10.3844/ajassp.2016.1394.1399 | |
学科分类:自然科学(综合) | |
来源: Science Publications | |
![]() |
【 摘 要 】
ZnO:Ga thin films were deposited on corning glass by dc magnetron sputtering. Influence of Ga-doped concentrations on the structural and optical properties of ZnO:Ga thin films were investigated. The XRD patterns show that the crystallinity of deposited films improved with the increase of Ga concentrations from 1 to 2%, then decrease at 3% Ga concentrations. The optical transmittance of films with 1% and 2% Ga concentration reach 85% in the visible range, while at 3% Ga concentration the transmittance of film only 70%. We observed that the band gap of film change due to the addition of Ga dopant. The band gap of the films are 3.27, 3.28 and 3.21 eV for 1, 2 and 3% Ga-doped concentrations, respectively.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
---|---|---|---|
RO201911300758734ZK.pdf | 238KB | ![]() |