Influence of trapped flux on critical currents of Josephson junctions

IEICE Electronics Express

Torsten Reich¹  Pascal Febvre¹  F. Hermann Uhlmann²  Thomas Ortlepp²  Bjoern Ebert² 

[1] Microwave and Characterization Laboratory, IMEP-LAHC, UMR CNRS 5130, University of Savoie;Institute of Information Technology, Ilmenau University of Technology, RSFQ Design Group

关键词: josephson junction;    trapped flux;    moats;    RSFQ;   

DOI  :  10.1587/elex.5.431

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(10)Cited-By(2)This paper investigates the influence of external field on the distribution of the critical current of Josephson junctions. The external field can cause trapped flux which may reduce the critical current. Experimental results show a formation of bunches in the distribution of the critical current when the external magnetic field rises a certain limit. From a theoretical point of view this formation can only be explained by attractive pinning points in the vicinity of the junction. The Josephson junctions were fabricated with the 1kA/cm2 Nb/Al2O3/Nb trilayer process of FLUXONICS Foundry.

【 授权许可】

Unknown