Ensuring a High Quality Digital Device through Design for Testability

CIT. Journal of Computing and Information Technology

Ngene, Christopher Umerah¹ 

[1] Department of Computer Engineering, University of Maiduguri, Nigeria

关键词: design for testability;    digital devices;    faults;    defect level;    reliability;    testing;   

DOI  :  

学科分类：计算机科学（综合）

来源: Sveuciliste u Zagrebu

【 摘 要 】

An electronic device is reliable if it is available for use most of the times throughout its life. The reliability can be affected by mishandling and use under abnormal operating conditions. High quality product cannot be achieved...

【 授权许可】

Unknown