PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices

IEICE Electronics Express

Dawood Alnajjar¹  Yukio Mitsuyama²  Masanori Hashimoto¹  Takao Onoye¹ 

[1] Department of Information Systems Engineering, Osaka University;School of Systems Engineering, Kochi University of Technology

关键词: dynamic voltage variations;    voltage scaling;    replica circuits;    time diversity;    timing errors;    error prediction;    error detection;    variation tolerant circuits;   

DOI  :  10.1587/elex.10.20130081

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(12)Cited-By(3)This paper studies performance and timing failure probability of time-shifted redundant circuits and path-/circuit-replica circuits. Measurement-based experiments using a fabricated test chip are performed. For an approximately similar false positive error probability for the path-replica and circuit-replica, the false negative error probability of the circuit-replica is approximately two orders of magnitude less than that of the path-replica circuits. When attaining a false negative error of zero, the probability of error detection and re-execution in time-shifted redundant circuits is comparable to, or rather smaller than that of the path-replica circuits.

【 授权许可】

Unknown