IEICE Electronics Express | |
PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices | |
Dawood Alnajjar1  Yukio Mitsuyama2  Masanori Hashimoto1  Takao Onoye1  | |
[1] Department of Information Systems Engineering, Osaka University;School of Systems Engineering, Kochi University of Technology | |
关键词: dynamic voltage variations; voltage scaling; replica circuits; time diversity; timing errors; error prediction; error detection; variation tolerant circuits; | |
DOI : 10.1587/elex.10.20130081 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(12)Cited-By(3)This paper studies performance and timing failure probability of time-shifted redundant circuits and path-/circuit-replica circuits. Measurement-based experiments using a fabricated test chip are performed. For an approximately similar false positive error probability for the path-replica and circuit-replica, the false negative error probability of the circuit-replica is approximately two orders of magnitude less than that of the path-replica circuits. When attaining a false negative error of zero, the probability of error detection and re-execution in time-shifted redundant circuits is comparable to, or rather smaller than that of the path-replica circuits.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300631411ZK.pdf | 212KB | download |