| American Journal of Engineering and Applied Sciences | |
| Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine | Science Publications | |
| C. Surendra Dilip1  J. Joseph Prince1  P. Mani1  K. Manikandan1  | |
| 关键词: Optical Material; Semiconductors; Surfaces; Thin Films; | |
| DOI : 10.3844/ajeassp.2015.318.327 | |
| 学科分类:工程和技术(综合) | |
| 来源: Science Publications | |
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【 摘 要 】
The equimolar concentration thin films of CadmiumSulfide (CdxSx) with the complexing agent TEA weredeposited on a glass substrate by the SILAR technique. The crystalline naturewith face centered cubic crystal system of the CdS films is determined fromX-ray diffraction analysis. The broadened diffraction peaks indicated nanosized particles of the film materials. The surface morphology of the films wasstudied by SEM analysis. The Energy Dispersive Analysis of X-ray (EDAX) plotconfirms the equimolar composition of Cd and S ions in the film materials.Surface topography of the film was studied by AFM. The optical characteristicof absorbance, transmittance and band gap was analyzed by UV-visible spectra.The band gap energy of the material was observed as 2.18 eV and chemicalbonding was studied by FT-IR spectral analysis.
【 授权许可】
Unknown
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO201911300594600ZK.pdf | 494KB |
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