Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]

IEICE Electronics Express

Sanghyeon Baeg²  Saqib A. Khan²  Shi-Jie Wen¹ 

[1] Component Engineering Group, Cisco System Inc.;Department of Elec. & Comm. Engineering, Hanyang University

关键词: receiver;    mixer;    RF front-end;    multifunction;   

DOI  :  10.1587/elex.13.20168001

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 授权许可】

Unknown