期刊论文详细信息
IEICE Electronics Express | |
A 3.125-to-22-Gb/s multi-rate clock and data recovery using voltage-regulated active filter | |
Seung Hoon Kim1  Hanbyul Choi2  Kyungmin Lee2  Chaerin Hong2  Sung Min Park2  Sang-Bock Cho1  Xiao Ying2  | |
[1]School of Electrical Engineering, University of Ulsan | |
[2]Department of Electronics Engineering, Ewha Womans University | |
关键词: CDR; multi-rate; PVT variation; ring VCO; voltage-regulated active filter; | |
DOI : 10.1587/elex.11.20140953 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(8)This letter presents a multi-rate clock and data recovery circuit realized in a standard 65-nm CMOS technology, which operates from 3.125 Gb/s to 22 Gb/s. In order to cover the wide frequency range, a modified four-stage differential ring VCO is exploited, which provides not only the fast tracking ability from its coarse tuning, but also the precise tra cking from its fine tuning. Also, a voltage-regulated active filter is employed to reduce the ripples of the VCO control voltages. It helps to fasten the lock-in time of the proposed CDR circuit and improve the jitter characteristics against PVT variations. Measurements reveal that the CDR chip demonstrates very wide capture range of 3.125 �? 22 Gb/s, 3.3 ps,rms data jitter at 20 Gb/s, and 112-mW power dissipation from a single 1.2-V supply. The chip core occupies the area of 0.12 mm2 only.【 授权许可】
Unknown
【 预 览 】
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RO201911300515871ZK.pdf | 4586KB | download |