Erratum: Unified active Q factor formula for use in noise spectrum estimation from Leeson’s and Hajimiri’s models [IEICE Electronics Express Vol. 10 (2013) No. 24 pp. 20130806]

IEICE Electronics Express

Takashi Ohira¹  Takanari Minami¹ 

[1] Toyohashi University of Technology

关键词: worst-case performance;    association degree;    log block;    FAST;    flash translation layer;    NAND flash memory;   

DOI  :  10.1587/elex.11.20148001

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 授权许可】

Unknown