SEISMIC REFRACTION METHOD: A TECHNIQUE FOR DETERMINING THE THICKNESS OF STRATIFIED SUBSTRATUM | Science Publications

American Journal of Applied Sciences

Ochuko Anomohanran¹ 

关键词: Seismic Refraction;    Direct Arrivals;    Geophones;    Seismograph;   

DOI  :  10.3844/ajassp.2013.857.862

学科分类：自然科学（综合）

来源: Science Publications

【 摘 要 】

The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.

【 授权许可】

Unknown