STRUCTURAL AND TEMPERATURE DEPENDENT DIELECTRIC PROPERTIES OF TIN SUBSTITUTED COBALT FERRITES(SnxCo1-xFe2O4)

Digest Journal of Nanomaterials and Biostructures

S. Anjum¹ 

关键词: Crystallite size;    Annealing temperature;    Dielectric constant;    A. C conductivity;    Hopping length;   

DOI  :  

学科分类：生物技术

来源: Institute of Materials Physics

【 摘 要 】

A string of tin doped cobalt ferrites SnxCo1-xFe2O4 where (x=0, 0.2, 0.4, 0.6, 0.8, 1) samples have been prepared using powder metallurgy route, annealed at 1200oC. The structural analysis is accomplished using X-ray diffractometer. This analysis confirms that all the prepared samples have inverse cubic spinel structure. It is also revealed that the crystallite size and lattice parameter increase with the increasing concentration of tin (Sn2+) ions. This is due to the larger ionic radii of tin. The 3D vitalization of XRD data is simulated using diamond software. The dielectric properties of the prepared tin ferrites have been determined using inductor capacitor resistor (LCR) meter. An extensive analysis of frequency, concentration and temperature dependent dielectric properties of the synthesized samples are described in this paper. It is concluded that the dielectric constant and dielectric loss have been decreased and conductivity is increased as the frequency increases. The observed value of high-dielectric constant and dielectric tangent loss response at low frequencies has been attributed due to the presence of grain boundaries in these ferrites. Temperature acts as a significant factor in the enhancement of the dielectric constant, dielectric loss and a.c. conductivity owing to the mobility of ions which increases as the temperature increase.

【 授权许可】

Unknown