In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Quantum Beam Science

Schülli, Tobias¹  Davydok, Anton²  Leclere, Cedric³  Cornelius, ThomasW.⁴  Ren, Zhe⁵  Chahine, Gilbert⁶ 

[1] Author to whom correspondence should be addressed;CNRS, Aix Marseille University, University de Toulon, IM2NP Marseille, France;CNRS, SIMAP, Grenoble INP, University Grenoble Alpes, 38000 Grenoble, France;Helmholtz-Zentrum Geesthacht, Notkestr. 85, 22607 Hamburg, Germany;ID01/ESRF, 71 Avenue des Martyrs, CS40220, CEDEX 9, F-38043 Grenoble, France;Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany

关键词: synchrotron X-ray diffraction;    nanostructures;    nanomechanics;   

DOI  :  10.3390/qubs2040024

学科分类：电子、光学、磁材料

来源: mdpi

【 摘 要 】

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

【 授权许可】

CC BY