Proceedings | |
A Back-Illuminated Time-of-Flight Image Sensor with SOI-Based Fully Depleted Detector Technology for LiDAR Application | |
Yasutomi, Keita1  Nam, Ho Hai2  Lee, Sanggwon3  | |
[1] Author to whom correspondence should be addressed.;Presented at the Eurosensors 2018 Conference, Graz, Austria, 9â12 September 2018;Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan | |
关键词: CMOS image sensor (CIS); time-of-flight (ToF); silicon-on-insulator (SOI); back-side-illuminator (BSI); | |
DOI : 10.3390/proceedings2130798 | |
学科分类:社会科学、人文和艺术(综合) | |
来源: mdpi | |
【 摘 要 】
A back-illuminated time-of-flight (ToF) image sensor based on a 0.2 µm silicon-on-insulator (SOI) CMOS detector technology using fully-depleted substrate is developed for the light detection and ranging (LiDAR) applications. A fully-depleted 200 µm-thick bulk silicon is used for the higher quantum efficiency (QE) in a near-infrared (NIR) region. The developed SOI pixel structure has a 4-tapped charge modulator with a draining function to achieve a higher range resolution and to cancel background light signal. A distance is measured up to 27 m with a range resolution of 12 cm at the outdoor and average light power density is 150 mW/m2@30 m.
【 授权许可】
CC BY
【 预 览 】
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RO201910257428970ZK.pdf | 886KB | download |