Dual-edge triggered JK flip-flop with comprehensive analysis in quantum-dot cellular automata

The Journal of Engineering

Yongqiang Zhang¹  Guangjun Xie² 

[1] School of Electronic Science and Applied Physics, Hefei University of Technology , Hefei 230009 , People's Republic of China

关键词: dual-edge triggered structure;    robust triggered structure;    temperature 2.0 K;    CMOS-based integrated circuits;    QCA cells;    QCADesigner;    quantum-dot cellular automata;    probabilistic transfer matrix;    clock zones;    power dissipation;    dual-edge triggered JK flip-flop;    fundamental building gates;    structure reliability analysis;    QCA domain;    simulation tool;    integrated circuits;   

DOI  :  10.1049/joe.2018.0138

学科分类：工程和技术（综合）

来源: IET

【 摘 要 】

Quantum-dot cellular automata (QCA), a new computing paradigm at nanoscale, may be a prospective substitution of conventional complementary metal oxide semiconductor (CMOS)-based integrated circuits. A new dual-edge triggered JK flip-flop based on a novel dual-edge triggered structure with less fundamental building gates is proposed in QCA domain in this study. To get a more robust triggered structure, the probabilistic transfer matrix is employed to analyse the reliability of the structure. The functionalities of the dual-edge triggered structure and JK flip-flop are verified with QCADesigner, a simulation tool widely used. By arranging the clock zones serially and QCA cells logically, compared with previous circuits, both of the proposed triggered structure and JK flip-flop perform well in terms of cells count, area, complexity, QCA cost and power dissipation at different tunnelling energy levels at 2 K temperature, respectively.

【 授权许可】

CC BY