| Beilstein Journal of Nanotechnology | |
| Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy | |
| 关键词: atomic force microscopy (AFM); demodulation; digital signal processing; field-programmable gate array (FPGA); high-speed; Lyapunov filter; multifrequency; | |
| DOI : 10.3762/bjnano.9.47 | |
| 学科分类:地球科学(综合) | |
| 来源: Beilstein - Institut zur Foerderung der Chemischen Wissenschaften | |
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【 摘 要 】
An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its narrowband response. However, this demodulator suffers inherent bandwidth limitations as high-frequency mixing products must be filtered out and several must be operated in parallel. Many MF-AFM methods require amplitude and phase demodulation at multiple frequencies of interest, enabling both z-axis feedback and phase contrast imaging to be achieved. This article proposes a model-based multifrequency Lyapunov filter implemented on a field-programmable gate array (FPGA) for high-speed MF-AFM demodulation. System descriptions and simulations are verified by experimental results demonstrating high tracking bandwidths, strong off-mode rejection and minor sensitivity to cross-coupling effects. Additionally, a five-frequency system operating at 3.5 MHz is implemented for higher harmonic amplitude and phase imaging up to 1 MHz.
【 授权许可】
CC BY
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO201902197735246ZK.pdf | 6331KB |
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