Physical-aware gating element insertion for thermal-safe scan shift operation

IEICE Electronics Express

Joon-Sung Yang¹  Taehee Lee² 

[1] Department of Semiconductor and Display Engineering, Sungkyunkwan University;System LSI, Samsung Electronics Co. Ltd.

关键词: low power testing;    scan test;    gating element insertion;    thermal-safe scan shift operation;   

DOI  :  10.1587/elex.14.20161181

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

【 授权许可】

CC BY